In Situ Photoconductive Monitoring of Phthalocyanine Thin Film Growth

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Abstract
The in situ measurement of lateral photocurrent has been carried out while the vacuum evaporation of phthalocyanine (Pc) thin films was in progress. After a very steep rise ranging from 3 to 4 orders of magnitude, the photocurrent increase slowed abruptly around a film thickness of 5-6 nm. The scanning electron microscopic observation of Pc layers have revealed the existence of cluster structures at an early stage of thin film growth. The behaviors of the in situ photocurrents are understood in terms of the growth and coalescence of the cluster structures.