Exhaustion mechanisms in the Preyield domain of niobium single crystals at low temperatures
- 1 January 1975
- journal article
- Published by EDP Sciences in Journal de Physique
- Vol. 36 (9) , 823-833
- https://doi.org/10.1051/jphys:01975003609082300
Abstract
Pure niobium single crystals were tested by tension and by stress-relaxation at stresses below the macroscopic yield stress and at temperatures between 4.2 and 70 K. The slope of the stress-strain curve and the amount of stress relaxation were investigated as a function of the nature and density of dislocations initially present in the sample. In the preyield domain the dislocation mobility was found to be governed by a thermally activated phenomenon associated to an exhaustion mechanism. This behaviour was quantitatively discussed in a model, in which edge dislocations undergo fragmentation, when the stress increases, as a result of their interaction with interstitial impuritiesKeywords
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