Oxide characterization and behavior at CuCu and CuCuOx interfaces
- 1 February 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 136 (2) , L31-L34
- https://doi.org/10.1016/0040-6090(86)90291-9
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Diffusitivity of oxygen in copperScripta Metallurgica, 1981
- Identification of Cu(I) and Cu(II) oxides by electron spectroscopic methods: AES, ELS and UPS investigationsJournal of Electron Spectroscopy and Related Phenomena, 1980
- The formation of a double oxide layer on pure copperOxidation of Metals, 1977
- Oxide removal and desorption of oxygen from partly oxidized thin films of copper at low pressuresOxidation of Metals, 1976
- Oxide nucleation on thin films of copper duringin Situ oxidation in an electron microscopeOxidation of Metals, 1975