Statistical Analysis/Simulation of a Three Ray Model for Multipath Fading With Applications to Outage Prediction
- 1 April 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal on Selected Areas in Communications
- Vol. 5 (3) , 389-401
- https://doi.org/10.1109/jsac.1987.1146548
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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