An accurate absolute scattering factor for silicon

• 1 January 1969
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
• Vol. 25  (1) , 134-138
• https://doi.org/10.1107/s0567739469000210

Abstract

Keywords

• BRAGG REFLEXION
• SYSTEMATIC ERRORS
• SILICON
• CONSIDERABLE DETAIL
• SCATTERING FACTOR