Reliabllity Techniques for Electronic Circuit Design
- 1 September 1958
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IRE Transactions on Reliability and Quality Control
- Vol. PGRQC-14 (00974552) , 9-16
- https://doi.org/10.1109/ire-pgrqc.1958.5007177
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Designing for reliabilityIRE Transactions on Reliability and Quality Control, 1956
- On the Cumulative Effect of Chance DeviationsJournal of the Royal Statistical Society Series B: Statistical Methodology, 1954
- LXXVI. The accumulation of chance effects and the Gaussian frequency distributionJournal of Computers in Education, 1947
- XLVI. The accumulation of chance effects and the Gaussian frequency distributionJournal of Computers in Education, 1944