X-Ray Photoelectron Spectroscopic Studies of Valence States Produced by Ion-Sputtering Reduction
- 1 May 1972
- journal article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 26 (3) , 355-357
- https://doi.org/10.1366/000370272774352092
Abstract
X-ray photoelectron spectroscopic measurements of various valence states of Fe and Cu in several compounds using ion-sputtering reduction are presented, and the potential usefulness of this time-dependent and in situ method is discussed.Keywords
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