The Step Stress method of accelerated life testing
- 1 December 1963
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 2 (3) , 215-225
- https://doi.org/10.1016/0026-2714(63)90007-6
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- The reliability of a silicon alloy transistorMicroelectronics Reliability, 1962