Capacitance and dielectric constant of Cd1−xMnxTe
- 15 May 1985
- journal article
- letter
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 57 (10) , 4803-4804
- https://doi.org/10.1063/1.335502
Abstract
We have measured the electrical impedance of CdTe and Cd0.55Mn0.45Te crystals at temperatures between 82 and 104 K using frequencies between 20 kHz and 2.0 MHz. From the capacitance results we determined that the dielectric constant was only slightly smaller for x=0.45 than for x=0—a result important for the understanding of electromechanical coupling in Cd1−xMnxTe.This publication has 2 references indexed in Scilit:
- Diluted magnetic semiconductors: An interface of semiconductor physics and magnetism (invited)Journal of Applied Physics, 1982
- Far infrared reflection spectra of MnxCd1−x Te mixed crystalsPhysica Status Solidi (b), 1978