A cathodoluminescence detection system for TEM/STEM
- 1 August 1983
- journal article
- Published by Cambridge University Press (CUP) in Proceedings, annual meeting, Electron Microscopy Society of America
- Vol. 41, 146-147
- https://doi.org/10.1017/s0424820100074562
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Investigation of the electronic effects of dislocations by stemUltramicroscopy, 1981
- Observation of cathodoluminescence at single dislocations by STEMPhilosophical Magazine A, 1980
- Nonradiative recombination at dislocations in III–V compound semiconductorsJournal of Microscopy, 1980