Contact boundary conditions and the Dyakonov–Shur instability in high electron mobility transistors
- 1 August 1997
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 82 (3) , 1242-1254
- https://doi.org/10.1063/1.365895
Abstract
Dyakonov and Shur have proposed a novel device structure based on dc biasing an ordinary high electron mobility transistor (HEMT) while subjecting it to unusual ac boundary conditions at its source and drain [M. Dyakonov and M. Shur, Phys. Rev. Lett. 71, 2465 (1993)]. Under these conditions, the drifting two-dimensional electron gas within the HEMT channel acts as a trapped one-component plasma which exhibits damped normal-mode oscillations similar to those of an organ pipe under zero dc bias, and an unexpected instability and gain at large dc biases. In this article, the work of Dyakonov and Shur is generalized by allowing the plasma more hydrodynamic degrees of freedom. In particular, it is found that the description used by Dyakonov and Shur must be generalized to incorporate a more complicated picture of the plasma modes.This publication has 9 references indexed in Scilit:
- Shallow water analogy for a ballistic field effect transistor: New mechanism of plasma wave generation by dc currentPhysical Review Letters, 1993
- Analysis of MODFET microwave characteristicsIEEE Transactions on Electron Devices, 1987
- Double-drift plasma instabilities in contiguous two-dimensional electron and hole gases: A solid-state two-stream amplifierJournal of Applied Physics, 1985
- Linear response of a semi-infinite substrate with a two-dimensional conductive surface layer in the plasma-pole approximationPhysical Review B, 1983
- Far infrared emission from plasma oscillations of Si inversion layersSolid State Communications, 1980
- Observation of the Two-Dimensional Plasmon in Silicon Inversion LayersPhysical Review Letters, 1977
- Theory of Surface Waves Coupled to Surface CarriersJournal of the Physics Society Japan, 1974
- Recombination velocity effects on current diffusion and imref in schottky barriersSolid-State Electronics, 1971
- Current transport in metal-semiconductor barriersSolid-State Electronics, 1966