Fractography of Thermal‐Shock‐Cracked Multilayer Capacitors
- 1 December 1989
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 72 (12) , 2241-2246
- https://doi.org/10.1111/j.1151-2916.1989.tb06068.x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Mechanical Behavior of Ferroelectric CeramicsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1986
- Evaluation of Reliability of Brittle Components by Thermal Stress TestingJournal of the American Ceramic Society, 1985
- Fabrication Reliability of Ceramics: Controlling Flaw PopulationsMRS Proceedings, 1985
- Analysis of soldering-induced cracking of BaTiO3ceramic capacitorsFerroelectrics, 1983