Characterization of adhesive and coating constituents by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). Part 1: Epoxy‐terminated diglycidyl polyethers of bisphenol‐A and propal‐2‐ol

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Abstract
A series of epoxide resins typically used in adhesive and coating applications have been characterized by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). Using thin‐film silver cationization, oligomers containing up to 16 bisphenol‐A groups were detected for the epoxide‐terminated diglycidyl polyethers of bisphenol‐A and propan‐s‐ol that comprise the bulk resins. For the higher molecular weight resins, the results indicate the additional presence of monoglycol‐, diglycol‐ and phenol‐terminated oligomers. For thicker film specimens, the spectra exhibit signals characteristic of the terminal epoxide and the bisphenol‐A components comprising the oligomer chains. Furthermore, the relative intensities of these diagnostic signals reflect the compositions of the epoxide resins in a quantitative manner.