Modeling of thin-film media with advanced microstructure for ultrahigh density recording
- 15 May 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 75 (10) , 6135-6137
- https://doi.org/10.1063/1.355433
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Effect of microstructural features on media noise in longitudinal recording mediaJournal of Applied Physics, 1993
- Transition noise properties in longitudinal thin-film mediaIEEE Transactions on Magnetics, 1993
- Effect of in-plane easy axis orientation in narrow track recordingIEEE Transactions on Magnetics, 1993
- Micromagnetic studies of thin metallic films (invited)Journal of Applied Physics, 1988