Precision measurement of
- 1 November 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 284 (1) , 143-146
- https://doi.org/10.1016/0168-9002(89)90268-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Determination ofh/mnMetrologia, 1986
- The lattice parameter of highly pure silicon single crystalsZeitschrift für Physik B Condensed Matter, 1982
- Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon CrystalPhysical Review Letters, 1981