Quantitative intensity measurements using a soft X-ray streak camera
- 1 April 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 19 (4) , 616-621
- https://doi.org/10.1109/jqe.1983.1071907
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- A soft X-ray streak cameraIEEE Journal of Quantum Electronics, 1983
- Photoelectric quantum efficiencies and filter window absorption coefficients from 20 eV to 10 KeVJournal of Applied Physics, 1981
- The characterization of x-ray photocathodes in the 0.1–10-keV photon energy regionJournal of Applied Physics, 1981
- Time-Resolved X-Ray Spectroscopy of Laser-Produced PlasmasPhysical Review Letters, 1980
- The interaction of 1.06 μm laser radiation with high Z disk targetsPhysics of Fluids, 1979
- 0.1–10-keV x-ray-induced electron emissions from solids—Models and secondary electron measurementsJournal of Applied Physics, 1977