Single event effect testing of the Intel 80386 family and the 80486 microprocessor
Open Access
- 1 June 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (3) , 879-885
- https://doi.org/10.1109/23.510728
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- SEU tests of a 80386 based flight-computer/data-handling system and of discrete PROM and EEPROM devices, and SEL tests of discrete 80386, 80387, PROM, EEPROM and ASICsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003