Use of Gated Image Converters at High Light Intensities

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Abstract
Pattern reproduction problems arising with the use of image converters operating at high light levels in gated regimes in the microsecond range are examined. Potential gradients developed across the finite resistance of the photocathode are ascertained to be the mechanism causing distortion. Theoretical formulas are derived to describe the photocathode potential for the case of homogeneous illumination and to estimate the influence of such extraneous fields on the electron‐optical imaging. Three methods of remedy are discussed, one of which is supported by theoretical and experimental evidence presented in the paper.

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