2-26.5 GHZ On-Wafer Noise and S-Parameter Measurements Using a Solid State Tuner

1 November 1989

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. 16, 33-40
https://doi.org/10.1109/arftg.1989.323954

Abstract

A new 2-26.5 GHz on wafer noise parameter measurement is presented. A solid state impedance tuner based test set in conjunction with a vector network analyzer (NWA) and a noise figure system (NFS) can determine the noise and S-parameters of the devices.

Keywords

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