Angle-Resolved Plane Wave X-Ray Topography

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Abstract
A new X-ray topographic scheme was constructed by using a three crystal diffractometer of the (+, -, +) parallel setting. The first, second and third crystals are used as the collimator, sample and analyzer, respectively. With this scheme a plane wave image of a dislocation was angularly analyzed and the diffracted wave selected by the crystal analyzer was recorded on a photographic plate. A minute difference in direction of the diffracted X-rays, which is responsible for the fine structures of the image, was topographically observed. The formation mechanism of defect images is discussed.