Enhancement of Piezoelectric Surface-Wave Coupling by Thin-Film Perturbation

15 October 1971

journal article
research article
Published by AIP Publishing in Applied Physics Letters

Vol. 19 (8) , 279-280
https://doi.org/10.1063/1.1653917

Abstract

Experimental measurements of interdigital transducer input impedance are used to demonstrate that the coupling constant for piezoelectric surface waves can be enhanced by the use of an appropriate thickness dielectric overlay film. Measurements of the SiO₂/YZ lithium niobate configuration are described and compared with an exact calculation and a qualitative perturbation analysis.

Keywords

SURFACE WAVE
COUPLING CONSTANT
PERTURBATION ANALYSIS
THIN FILM

This publication has 2 references indexed in Scilit:

PIEZOELECTRIC ACOUSTIC SURFACE WAVES FOR A FILM ON SUBSTRATE
Applied Physics Letters, 1971
Design of Surface Wave Delay Lines with Interdigital Transducers
IEEE Transactions on Microwave Theory and Techniques, 1969