Multiple Fault Detection in Combinational Circuits: Algorithms and Computational Results

1 March 1973

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-22 (3) , 235-240
https://doi.org/10.1109/T-C.1973.223700

Abstract

A new approach is developed for finding multiple fault detection tests under quite arbitrary fault models. Computational results are reported and discussed.

Keywords

FAULT DETECTION
MODELS
COMBINATIONAL CIRCUITS
MULTIPLE FAULT
NEW APPROACH
ARBITRARY FAULT
DETECTION IN COMBINATIONAL

This publication has 0 references indexed in Scilit: