Analog circuit fault diagnosis based on sensitivity computation and functional testing
- 1 March 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 9 (1) , 30-39
- https://doi.org/10.1109/54.124515
Abstract
An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.<>Keywords
This publication has 13 references indexed in Scilit:
- Biolink: A New Myoelectric Pointing Device For interactive Computer Systems: Evaluation Of The Human Performance And Integrated RealizationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Functional testing of circuits and SMD boards with limited nodal accessPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Fault diagnosis in analogue circuits using AI techniquesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Design for testability for mixed analog/digital ASICsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Time-domain testing strategies and fault diagnosis for analog systemsIEEE Transactions on Instrumentation and Measurement, 1990
- Large change response sensitivity of linear networksIEEE Transactions on Circuits and Systems, 1980
- Large-change sensitivities of linear digital networksIEEE Transactions on Circuits and Systems, 1978
- Differential-incremental-sensitivity relationshipsElectronics Letters, 1972
- Multiparameter sensitivity in active RC networksIEEE Transactions on Circuit Theory, 1971
- Multiparameter sensitivity problems in network theoryProceedings of the Institution of Electrical Engineers, 1970