Analysis of tunneling magnetic force microscopy using a flexible triangular probe
- 1 September 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 28 (5) , 3135-3137
- https://doi.org/10.1109/20.179736
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Magnetic field imaging by using magnetic force scanning tunneling microscopyApplied Physics Letters, 1992
- Tunneling-stabilized magnetic force microscopy of bit tracks on a hard diskIEEE Transactions on Magnetics, 1991
- Magnetic force microscopy: General principles and application to longitudinal recording mediaJournal of Applied Physics, 1990
- Analysis of in-plane bit structure by magnetic force microscopyJournal of Applied Physics, 1990
- Theoretical approach to magnetic force microscopyPhysical Review B, 1989