A k-out-of-n three-state devices system with common-cause failures
- 1 January 1978
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 18 (5) , 447-448
- https://doi.org/10.1016/0026-2714(78)90868-5
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- A 4-Unit Redundant System with Common-Cause FailuresIEEE Transactions on Reliability, 1977
- Literature survey on three-state device reliability systemsMicroelectronics Reliability, 1977