Effects of Fast Temperature Cycling on Aluminum and Gold Metal Systems

• 1 April 1975
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• p. 113-120
• https://doi.org/10.1109/irps.1975.362684

Abstract

Keywords

• GOLD
• CONTROL SYSTEMS
• POWER TRANSISTORS
• SYSTEM TESTING
• TEMPERATURE CONTROL
• METALLIZATION
• ALUMINUM