FIELD EMISSION SHADOW MICROSCOPY
- 1 February 1968
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 12 (3) , 100-102
- https://doi.org/10.1063/1.1651891
Abstract
An electron field emitter is used as an approximate point source of electrons to produce magnified shadows, or profile images, of small electrically conducting objects in ultrahigh vacuum. Some electrical and electron optical properties of this type of microscopy are described.Keywords
This publication has 2 references indexed in Scilit:
- Morphological Changes of a Surface of Revolution due to Capillarity-Induced Surface DiffusionJournal of Applied Physics, 1965
- Field Ionization and Field Ion MicroscopyPublished by Elsevier ,1960