Study of the x-ray photoelectron spectrum of tungsten—tungsten oxide as a function of thickness of the surface oxide layer
- 31 December 1973
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 1 (2) , 161-168
- https://doi.org/10.1016/0368-2048(72)80029-x
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Determination of the electron escape depth in gold by means of ESCASolid State Communications, 1970
- Photoelectron Spectra of Methane, Silane, Germane, Methyl Fluoride, Difluoromethane, and TrifluoromethaneThe Journal of Chemical Physics, 1970
- Auger Electron Spectroscopy of fcc Metal SurfacesJournal of Applied Physics, 1968
- RANGE OF Xe133 AND Ar41 IONS OF KEV ENERGIES IN TUNGSTENCanadian Journal of Physics, 1963