In situ microwave reflection coefficient measurements for smooth and rough exterior wall surfaces
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Mechanisms governing UHF propagation on single floors in modern office buildingsIEEE Transactions on Vehicular Technology, 1992
- Theoretical prediction of mean field strength for urban mobile radioIEEE Transactions on Antennas and Propagation, 1991
- Toward a Theory of Reflection by a Rough SurfaceProceedings of the IRE, 1953