Theoretical analysis of the concentration and distribution of carriers in YBa2Cu3O7x

Abstract
An ionic model and the total-energy method are used to calculate the density and distribution of carriers in YBa2 Cu3 O7x systems and, in particular, to understand the relationship between the density of carriers and the density of oxygen vacancies in YBa2 Cu3 O7x. It is shown that the density of carriers is normally 1-x per unit cell and the carriers are holes on the oxygen ions in the CuO2 planes. In addition, for the 1+ valence copper ions Cu+ present in the CuO□ plane, the density of Cu+ is normally x per unit cell.