Double Michelson Interferometer For Contactless Thermal Expansion Measurements
- 25 December 1979
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- p. 204-208
- https://doi.org/10.1117/12.957858
Abstract
Laser interferometry provides adequate range and resolution for thermal expansion measurements. However, accuracy can be achieved only if the relative motions of the sample and the optics are known and/ or accounted for. The system described incorporates self compensating features into the optics. Signal processing techniques for real time length change recording are also discussed.Keywords
This publication has 0 references indexed in Scilit: