Real-Time Observation of the Interaction between Flux Lines and Defects in a Superconductor by Lorentz Microscopy
- 1 May 1994
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 33 (5R) , 2534-2540
- https://doi.org/10.1143/jjap.33.2534
Abstract
Flux lines in a Nb thin film at 4.5 K were observed by using a 300-kV field-emission transmission electron microscope equipped with a TV system. When the magnetic field applied to the film was suddenly changed, flux lines moved until arriving at an equilibrium state by hopping from one pinning center to another. Frame-by-frame observation of videotape recorded with a time resolution of 1/30 s revealed how individual flux lines behaved when they came across subgrain boundaries, and interacted with the boundaries.Keywords
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