Ellipsometry in the study of selective radiation—Absorbing surfaces
- 31 December 1977
- journal article
- Published by Elsevier in Solar Energy
- Vol. 19 (3) , 271-276
- https://doi.org/10.1016/0038-092x(77)90070-6
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Principles and applications of selective solar coatingsJournal of Vacuum Science and Technology, 1975
- Thin film coatings in solar−thermal power systemsJournal of Vacuum Science and Technology, 1975
- Ellipsometry and its applications to surface examinationJournal of Physics E: Scientific Instruments, 1973
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Some New Formulas for Determining the Optical Constants from Measurements on Reflected LightJournal of the Optical Society of America, 1955
- The Calibration of Quarter-Wave Plates*Journal of the Optical Society of America, 1952