Stimulated emission spectroscopy of van der Waals vibrational levels of glyoxal(X̃ 1Ag)⋅Ar
- 1 June 1988
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 88 (11) , 7240-7241
- https://doi.org/10.1063/1.454376
Abstract
Stimulated emission spectroscopy was used to study the electronic ground state vibration–rotation levels of van der Waals complexes generated in a supersonic beam. This technique can be used to study all the vibrational levels with nonvanishing Franck–Condon factors from the electronic excited states with 0.04 cm−1 resolution. Five van der Waals vibrational levels in the X̃ state were directly observed in the stimulated emission spectra and were assigned to the fundamental and first overtone levels of the two Ar⋅glyoxal bending modes and the stretching fundamental level. In addition, the rotational constants and the structure were determined for both the à and X̃ state complex, together with the vibrational term values and the widths of single rotational levels of the three glyoxal vibrations in the glyoxal⋅Ar complex, the C–C stretch v4=1, the CH wag v8=1 and the OCC bend v5=1 level.Keywords
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