Errors in the Measurement of Film Thickness by Multiple-Beam Interferometry
- 1 October 1958
- journal article
- Published by Springer Nature in Nature
- Vol. 182 (4643) , 1149-1150
- https://doi.org/10.1038/1821149b0
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- The Thickness Measurement of Thin Films by Multiple Beam InterferometryJournal of Applied Physics, 1950