A radial exploration approach to manufacturing yield estimation and design centering
- 1 September 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 26 (9) , 768-774
- https://doi.org/10.1109/tcs.1979.1084699
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The simplicial approximation approach to design centeringIEEE Transactions on Circuits and Systems, 1977
- Tracking sensitivity: a practical algorithmElectronics Letters, 1977
- Regionalization: A method for generating joint density estimatesIEEE Transactions on Circuits and Systems, 1976
- A nonlinear programming approach to optimal design centering, tolerancing, and tuningIEEE Transactions on Circuits and Systems, 1976
- Multiparameter large-change sensitivity analysis and systematic explorationIEEE Transactions on Circuits and Systems, 1975