High-resolution Compton profile spectrometer for 29.5-keV x rays with a combination of crystal analyzer and imaging plate
- 1 July 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (7) , 2402-2405
- https://doi.org/10.1063/1.1140730
Abstract
A high-resolution Compton spectrometer has been installed for 29.5-keV incident x rays from a vertical wiggler inserted in the 2.5-GeV storage ring of the Photon Factory at Tsukuba. This spectrometer consists of bent-crystal monochromator, a Cauchois-type bent-crystal analyzer, and an imaging plate as a position sensitive detector. The overall momentum resolution is 0.084 a.u. for the incident x-ray energy of 29.5 keV. High-resolution Compton profile measurements on Al, a quasicrystal Al-Li-Cu, and solid and liquid phase of Li are shown to demonstrate the performance of this spectrometer.Keywords
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