Computer program for peak identification in secondary ion mass spectra
- 1 October 1975
- Vol. 25 (9-10) , 409-413
- https://doi.org/10.1016/0042-207x(75)90486-8
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Theoretical and experimental aspects of secondary ion mass spectrometryVacuum, 1974
- Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectraAnalytical Chemistry, 1973
- Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)Surface Science, 1973
- Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copperRadiation Effects, 1973
- Secondary ion mass analysis, Technique for three-dimensional characterizationAnalytical Chemistry, 1972
- Experience with a Computer Program for Residual Gas AnalyzersJournal of Vacuum Science and Technology, 1972