Bias Stress Measurements on High Performance AlGaN/GaN HFET Devices

• 22 November 2001
• journal article
• research article
• Published by Wiley in Physica Status Solidi (a)
• Vol. 188  (1) , 233-237
• https://doi.org/10.1002/1521-396x(200111)188:1<233::aid-pssa233>3.3.co;2-s

Abstract

Keywords

• 68.35.GY
• 73.40.KP
• 73.50.DN
• 85.30.TV
• S7.14