Interpretation of-Values inJunction Transistors
- 1 February 1953
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 89 (3) , 651-653
- https://doi.org/10.1103/physrev.89.651
Abstract
By the measurement of five parameters in several junction transistors, viz., the conductivities and diffusion lengths of minority carriers in the emitter and base regions and the widths of the base regions, the current amplification factor of the transistors has been computed from theory. Previous to this investigation two of the parameters associated with the thin -layer had not been measured. The quantity also was obtained independently by two alternate methods: (1) by measuring the collector-emitter current characteristic, and (2) by measuring the apparent quantum efficiency of the transistor as a two-electrode photocell with a floating base. The three determined values of for each sample agree within the experimental error.
Keywords
This publication has 4 references indexed in Scilit:
- Junction TransistorsPhysical Review B, 1951
- Theory and Experiment for a GermaniumJunctionPhysical Review B, 1951
- Growth of Germanium Single Crystals ContainingJunctionsPhysical Review B, 1951
- Measurement of Hole Diffusion in-Type GermaniumPhysical Review B, 1951