Atomic scale observations of the chemical composition of a metal/ceramic interface

This publication has 13 references indexed in Scilit:

• High-resolution electron microscopy of interfaces in fcc materials
  Ultramicroscopy, 1991
• Improved imaging of small coherent precipitates by bright field / zone axis incidence TEM
  Scripta Metallurgica et Materialia, 1991
• A system for systematically preparing atom-probe field-ion-microscope specimens for the study of internal interfaces
  Review of Scientific Instruments, 1990
• Transmission electron microscopy characterization of precipitates
  Ultramicroscopy, 1989
• Characterization of Ag/CdO interfaces
  Philosophical Magazine Letters, 1988
• Spectroscopic information from high resolution images
  Ultramicroscopy, 1988
• Field-ion microscopy of internally oxidized copper alloys
  Metal Science, 1976
• A quantitative study of vacancy defects in quenched platinum by field ion microscopy and electrical resistivity—I. Experimental results
  Acta Metallurgica, 1973
• The direct observation of point defects in irradiated or quenched metals by quantitative field ion microscopy
  Journal of Physics F: Metal Physics, 1973
• Diffraction contrast from spherically symmetrical coherency strains
  Philosophical Magazine, 1963