Analysis of Certain Errors in the X-Ray Reflection Method for the Quantitative Determination of Preferred Orientations
- 1 March 1952
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 23 (3) , 341-345
- https://doi.org/10.1063/1.1702204
Abstract
The reflection method for quantitative determination of pole figures, proposed by Schulz, proved to be limited with respect to the range of tilting angles in which satisfactory results can be obtained. It is shown that the previously unexplained decrease in the diffracted intensity with increasing tilting angle for specimens with random orientation distribution can be accounted for on the basis of an elementary analysis of defocusing effects. Experimental evidence is presented to show that variation of the receiving slit length and of the main slit width has the effect predicted by the analysis. The importance of accurate specimen alignment is discussed, and a satisfactory alignment check procedure is described.This publication has 2 references indexed in Scilit:
- A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949
- A Technique for Quantitative Determination of Texture of Sheet MetalsJournal of Applied Physics, 1948