Core-level photoemission studies of surfaces, interfaces, and overlayers
- 1 January 1988
- journal article
- research article
- Published by Taylor & Francis in Critical Reviews in Solid State and Materials Sciences
- Vol. 14 (3) , 269-317
- https://doi.org/10.1080/10408438808243735
Abstract
Photoemission spectroscopy has proved to be an extremely powerful technique for the determination of the electronic properties and surface atomic structures of solids. Core-level spectroscopy, in particular, has become increasingly popular for the studies of surfaces, adsorbates, interfaces, and overlayers.Keywords
This publication has 78 references indexed in Scilit:
- Photoemission studies of CdTe(100) and the Ag-CdTe(100) interface: Surface structure, growth behavior, Schottky barrier, and surface photovoltagePhysical Review B, 1986
- Photoemission-Based Photovoltage Probe of Semiconductor Surface and Interface Electronic StructurePhysical Review Letters, 1986
- Surface core level spectroscopy of transition metals: A new tool for the determination of their surface structureSurface Science Reports, 1985
- Determination of the Fermi-level pinning position at Si(111) surfacesPhysical Review B, 1983
- Photoemission from surface-atom core levels, surface densities of states, and metal-atom clusters: A unified picturePhysical Review B, 1983
- Core-electron binding-energy shifts at surfacesPhysical Review B, 1982
- Ultraviolet radiation—an incisive and versatile toolPhysics Today, 1981
- Facilities in the United StatesPhysics Today, 1981
- Photoemission in Solids IPublished by Springer Nature ,1978
- Surface Photovoltage Spectroscopy—A New Approach to the Study of High-Gap Semiconductor SurfacesJournal of Vacuum Science and Technology, 1973