Fabrication and characterization of freely positionable silicon-on-sapphire photoconductive probes

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Abstract
A study of external photoconductive sampling is reported. We describe in detail the fabrication of photoconductive probes on silicon-on-sapphire. Measurements of electric pulse propagation on terahertz-dipole antennas serve to characterize the linearity, the sensitivity, the time resolution, and the dielectric invasiveness of the probes.