Acoustic Microscopy Applied to SAW Dispersion and Film Thickness Measurement
- 1 March 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Sonics and Ultrasonics
- Vol. 27 (2) , 82-86
- https://doi.org/10.1109/t-su.1980.31152
Abstract
No abstract availableKeywords
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