The effect of the interfacial roughness on the reflection properties of multilayer X-ray mirrors
- 1 November 1987
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 261 (1-2) , 91-98
- https://doi.org/10.1016/0168-9002(87)90572-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A Scanning Soft X-Ray Microscope Using Normal Incidence MirrorsPublished by Springer Nature ,1984
- Multilayers for X-Ray Optical ApplicationsPublished by Springer Nature ,1984