Perpendicular anisotropy in FeCr sputtered films.

Abstract
Magnetic thin films of Fe1-xCrx (x=0.33 to 0.40) with perpendicular magnetization were obtained using the rf sputtering method for the first time. Fe66Cr34 deposited onto unheated substrate had Ku 6 × 105 erg/cm3, Ms 280 emu/cm3 and Hc⊥ 700 Oe. Film composition and substrate temperature during film preparation were the most important factors inducing perpendicular anisotropy. X-ray diffraction studies showed that the induction of perpendicular anisotropy was always accompanied by growth of the crystalline phase (Cr-dominan bcc phase). FeCr films also exhibited high corrosion resistivity in an oxidative environment. FeCr is a potential material for perpendicular magnetic recording.

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