On conversion from an energy scale to a depth scale in channelling experiments
- 1 December 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 19 (2) , 239-246
- https://doi.org/10.1016/0040-6090(73)90059-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Stopping power of energetic helium ions transmitted through thin silicon crystals in channelling and random directionsRadiation Effects, 1972
- Defect studies in crystals by means of channelingCanadian Journal of Physics, 1968
- Channeling of medium-mass ions through siliconCanadian Journal of Physics, 1968