Characterization of the Surface to Thiol Bonding in Self-Assembled Monolayer Films of C12H25SH on InP(100) by Angle-Resolved X-ray Photoelectron Spectroscopy
- 24 September 1999
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 15 (25) , 8640-8644
- https://doi.org/10.1021/la990467r
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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