Further measurements of helium concentration profiles in copper and their relation to blistering
- 31 October 1978
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 76-77, 249-250
- https://doi.org/10.1016/0022-3115(78)90149-6
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Helium irradiations of copper at 1 to 25 keV: range profiles, reemission, and blisteringCanadian Journal of Physics, 1978
- Doubly peaked helium depth profiles in copper and blisteringJournal of Nuclear Materials, 1977
- Role of integrated lateral stress in surface deformation of He-implanted surfacesJournal of Applied Physics, 1977
- Theory of the production and depth distribution of helium defect complexes by ion implantationJournal of Nuclear Materials, 1976
- A mechanism of surface blistering on metals irradiated with helium ionsJournal of Nuclear Materials, 1976